Rietveld refinement : practical powder diffraction pattern analysis using TOPAS
Bibliographic Information
- Title
- "Rietveld refinement : practical powder diffraction pattern analysis using TOPAS"
- Statement of Responsibility
- Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans
- Publisher
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- Walter de Gruyter
- Publication Year
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- c2019
- Book size
- 24 cm
- Series Name / No
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- : pbk
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Notes
Includes bibliographical references and index
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Details 詳細情報について
-
- CRID
- 1130566852408128512
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- NII Book ID
- BB29246568
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- ISBN
- 9783110456219
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- LCCN
- 2018954391
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- Web Site
- https://lccn.loc.gov/2018954391
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- Text Lang
- en
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- Country Code
- gw
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- Title Language Code
- en
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- Place of Publication
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- Berlin
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- Subject
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- LCSH: X-rays -- Diffraction
- LCSH: Crystallography
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- Data Source
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- CiNii Books