Scanning nonlinear dielectric microscopy : investigation of ferroelectric, dielectric, and semiconductor materials and devices
Bibliographic Information
- Title
- "Scanning nonlinear dielectric microscopy : investigation of ferroelectric, dielectric, and semiconductor materials and devices"
- Statement of Responsibility
- Yasuo Cho
- Publisher
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- Woodhead Publishing, An imprint of Elsevier
- Publication Year
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- c2020
- Book size
- 23 cm
- Series Name / No
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- : pbk
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1131693804097197824
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- NII Book ID
- BC02444783
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- ISBN
- 9780128172469
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- LCCN
- 2021444951
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- Web Site
- https://lccn.loc.gov/2021444951
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- Text Lang
- en
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- Country Code
- uk
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- Title Language Code
- en
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- Place of Publication
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- Duxford、U.K.
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- Classification
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- DC23: 621.381
- LCC: TK7872.F44
- DC23: 537.2448
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- Subject
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- LCSH: Ferroelectric devices
- LCSH: Dielectric devices
- LCSH: Semiconductors
- LCSH: Microscopy
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- Data Source
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- CiNii Books
