Terahertz Frequency Metrology Based on Frequency Comb
Journal
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- IEEE Journal of Selected Topics in Quantum Electronics
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IEEE Journal of Selected Topics in Quantum Electronics 17 (1), 191-201, 2011-01
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1360002218031422336
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- ISSN
- 15584542
- 1077260X
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- Data Source
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- Crossref
- KAKEN