Electric Field Effect in Al/SrTiO<sub>3</sub>/YBa<sub>2</sub>Cu<sub>3</sub>O<sub>y</sub> Structure in the Normal State
書誌事項
- 公開日
- 1992-10-01
- 権利情報
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- https://iopscience.iop.org/page/copyright
- https://iopscience.iop.org/info/page/text-and-data-mining
- DOI
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- 10.1143/jjap.31.l1411
- 公開者
- IOP Publishing
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説明
<jats:p> The electric field effect in YBa<jats:sub>2</jats:sub>Cu<jats:sub>3</jats:sub>O<jats:sub> <jats:italic>y</jats:italic> </jats:sub> (YBCO) thin film was investigated by means of drain-current modulation measurements on Al/(100)SrTiO<jats:sub>3</jats:sub>/(001)YBCO metal-insulator-superconductor field-effect transistors (MISFETs) in the normal state. Sufficient current modulation was obtained in every specimen without exception. Moreover, even an YBCO channel with a semi-insulating phase could be changed to a conductive state by the field effect. The semiconductor band model explained the observed electric field effect semi-quantitatively. </jats:p>
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 31 (10A), L1411-, 1992-10-01
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360003446841564032
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- NII論文ID
- 210000032843
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- ISSN
- 13474065
- 00214922
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- データソース種別
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