Observation of Band Gap in Epitaxial Bilayer Graphene Field Effect Transistors
Description
<jats:p> Bilayer graphene was grown on the Si-face of SiC by thermal decomposition. Its electronic properties were investigated in top-gate Hall bar devices. By controlling the carrier density using gate voltage, we were able to access the charge neutrality point. The conductance at the charge neutrality point showed a strong temperature dependence, and its temperature dependence was well fitted with thermal activation and variable-range hopping mechanisms. The electrical detection of a band gap opening in bilayer graphene grown on SiC is a promising step toward the realization of graphene-based electronics using epitaxial graphene. </jats:p>
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 50 (4S), 04DN04-, 2011-04-01
IOP Publishing
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Details 詳細情報について
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- CRID
- 1360003446856179712
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- NII Article ID
- 210000070405
- 210000138783
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- ISSN
- 13474065
- 00214922
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- Data Source
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- Crossref
- CiNii Articles
- KAKEN
- OpenAIRE