Ferromagnetic resonance measurements in sub-nanometer Fe films
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説明
We show that our ferromagnetic resonance (FMR) measurement based on the rectification effect is sufficiently sensitive for characterizing various static and dynamic magnetic properties of a sub-nanometer ferromagnetic film where the interfacial effects dominate. The extracted properties, such as the Lande g-factor, the effective demagnetizing field, and the Gilbert damping parameter, are reasonably well scaled with the film thickness, indicating that our measurements clearly capture the interfacial properties of the sub-nanometer-thick film. In particular, the capability of the g-factor extraction in the ultrathin film will be very helpful for characterizing the various interfacial effects involved with interfacial orbit moments and spin–orbit interactions.
収録刊行物
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- Applied Physics Express
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Applied Physics Express 8 (7), 073003-, 2015-06-16
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360003449884407680
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- NII論文ID
- 210000137585
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- ISSN
- 18820786
- 18820778
- https://id.crossref.org/issn/18820786
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- 資料種別
- journal article
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- データソース種別
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