Another origin of yield drop behavior in sapphire deformed via basal slip: Recombination of climb-dissociated partial dislocations

詳細情報 詳細情報について

• CRID

  1360004232497419008

• DOI

  10.1016/j.scriptamat.2017.06.001

• ISSN

  13596462

• Web Site

  https://api.elsevier.com/content/article/PII:S1359646217303032?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S1359646217303032?httpAccept=text/plain

• データソース種別

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