Fractal Nature of Metallic and Insulating Domain Configurations in a VO2 Thin Film Revealed by Kelvin Probe Force Microscopy
書誌事項
- 公開日
- 2015-05-18
- 資源種別
- journal article
- 権利情報
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- https://creativecommons.org/licenses/by/4.0
- https://creativecommons.org/licenses/by/4.0
- DOI
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- 10.1038/srep10417
- 公開者
- Springer Science and Business Media LLC
説明
<jats:title>Abstract</jats:title><jats:p>We investigated the surface work function (<jats:italic>W</jats:italic><jats:sub><jats:italic>S</jats:italic></jats:sub>) and its spatial distribution for epitaxial VO<jats:sub>2</jats:sub>/TiO<jats:sub>2</jats:sub>thin films using Kelvin probe force microscopy (KPFM). Nearly grain-boundary-free samples allowed observation of metallic and insulating domains with distinct<jats:italic>W</jats:italic><jats:sub><jats:italic>S</jats:italic></jats:sub>values, throughout the metal–insulator transition. The metallic fraction, estimated from<jats:italic>W</jats:italic><jats:sub><jats:italic>S</jats:italic></jats:sub>maps, describes the evolution of the resistance based on a two-dimensional percolation model. The KPFM measurements also revealed the fractal nature of the domain configuration.</jats:p>
収録刊行物
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- Scientific Reports
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Scientific Reports 5 (1), 10417-, 2015-05-18
Springer Science and Business Media LLC
