Measurement of electric field distribution using a conventional transmission electron microscope
説明
A simple and quick method to measure the electric field distribution near a specimen using a conventional transmission electron microscope has been developed. The electric field distribution around a field emitter needle was measured to evaluate the performance of the method. It was found that this method allows us to measure the 2D distribution of electric field quantitatively with error of10% with submicron spatial resolution. The dedicated aperture and software to construct an automated analysis system have been developed.
収録刊行物
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- Journal of Electron Microscopy
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Journal of Electron Microscopy 59 (S1), S89-S94, 2010-06-15
Oxford University Press (OUP)
