Role of coating defects in laser-induced damage to dielectric thin films

  • L. G. DeShazer
    Center for Laser Studies, University of Southern California, Los Angeles, California 90007
  • B. E. Newnam
    Center for Laser Studies, University of Southern California, Los Angeles, California 90007
  • K. M. Leung
    Center for Laser Studies, University of Southern California, Los Angeles, California 90007

書誌事項

公開日
1973-12-01
DOI
  • 10.1063/1.1654764
公開者
AIP Publishing

この論文をさがす

説明

<jats:p>The laser-induced damage thresholds of two different dielectric thin-film coatings increased with decreasing spot size and were invariant for spot sizes greater than 150 μm. A simple model has been suggested that the distribution and nature of coating defects have played an important role in this spot-size dependence, e.g., the probability of the laser beam striking a defect site will be greater for larger spot sizes and that damage in materials can be distinguished as defect damage and intrinsic damage.</jats:p>

収録刊行物

被引用文献 (1)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ