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A simple method to characterize substrate current in MOSFET's
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Journal
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- IEEE Electron Device Letters
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IEEE Electron Device Letters 5 (12), 505-507, 1984-12
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1360011145024448384
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- ISSN
- 07413106
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- Data Source
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- Crossref