Penetration depth measurements of single-crystal NbN films at millimeter-wave region

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  • Bokuji Komiyama
    Communications Research Laboratory, KARC, 588-2 Iwaoka, Nishi-ku, Kobe 651-24, Japan
  • Zhen Wang
    Communications Research Laboratory, KARC, 588-2 Iwaoka, Nishi-ku, Kobe 651-24, Japan
  • Masayoshi Tonouchi
    Communications Research Laboratory, KARC, 588-2 Iwaoka, Nishi-ku, Kobe 651-24, Japan

抄録

<jats:p>The zero temperature penetration depth λ(0) of single-crystal NbN thin films has been measured at 82 GHz using an open resonator. The NbN films used in this study have a (200) single-crystal structure and Tc and ρ20 (normal state resistivity at 20 K) are 16 K and 62 mΩ cm, respectively. λ(0) was obtained by applying a least-squares fit to the change of penetration depth using the BCS theory. We obtain λ(0)=194 nm, which shows good agreement with the calculated value from Tc,ρ20 and Δ(0).</jats:p>

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