Penetration depth measurements of single-crystal NbN films at millimeter-wave region
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- Bokuji Komiyama
- Communications Research Laboratory, KARC, 588-2 Iwaoka, Nishi-ku, Kobe 651-24, Japan
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- Zhen Wang
- Communications Research Laboratory, KARC, 588-2 Iwaoka, Nishi-ku, Kobe 651-24, Japan
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- Masayoshi Tonouchi
- Communications Research Laboratory, KARC, 588-2 Iwaoka, Nishi-ku, Kobe 651-24, Japan
抄録
<jats:p>The zero temperature penetration depth λ(0) of single-crystal NbN thin films has been measured at 82 GHz using an open resonator. The NbN films used in this study have a (200) single-crystal structure and Tc and ρ20 (normal state resistivity at 20 K) are 16 K and 62 mΩ cm, respectively. λ(0) was obtained by applying a least-squares fit to the change of penetration depth using the BCS theory. We obtain λ(0)=194 nm, which shows good agreement with the calculated value from Tc,ρ20 and Δ(0).</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 68 (4), 562-563, 1996-01-22
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360011145244871040
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- DOI
- 10.1063/1.116400
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- ISSN
- 10773118
- 00036951
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- データソース種別
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- Crossref