Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy

M. Balantekin, A. Atalar

doi:10.1063/1.2147708

Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy

M. Balantekin

Bilkent University , Electrical Engineering Department, Bilkent, TR-06800, Ankara, Turkey
A. Atalar

Bilkent University , Electrical Engineering Department, Bilkent, TR-06800, Ankara, Turkey

説明

<jats:p>Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials’ nanomechanical properties. These harmonics can be significantly enhanced by driving the cantilever close to a submultiple of its resonant frequency. We present the results of enhanced higher-harmonic imaging experiments on several samples. The results indicate that enhanced higher harmonics can be utilized effectively for both material characterization and surface roughness analysis with a high signal-to-noise ratio.</jats:p>