Combined static and dynamic automated test generation
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- Sai Zhang
- University of Washington
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- David Saff
- Google, Inc.
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- Yingyi Bu
- University of California, Irvine
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- Michael D. Ernst
- University of Washington
Journal
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- Proceedings of the 2011 International Symposium on Software Testing and Analysis
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Proceedings of the 2011 International Symposium on Software Testing and Analysis 353-, 2011-07-17
ACM