Filter-based ultralow-frequency Raman measurement down to 2 cm−1 for fast Brillouin spectroscopy measurement

DOI PDF 2 Citations
  • Xue-Lu Liu
    Chinese Academy of Sciences 1 State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, , Beijing 100083, China
  • He-Nan Liu
    Chinese Academy of Sciences 1 State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, , Beijing 100083, China
  • Jiang-Bin Wu
    Chinese Academy of Sciences 1 State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, , Beijing 100083, China
  • Han-Xu Wu
    Beijing Institute of Technology 3 Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, School of Optoelectronics, , Beijing 100081, China
  • Tao Zhang
    Beijing Institute of Technology 3 Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, School of Optoelectronics, , Beijing 100081, China
  • Wei-Qian Zhao
    Beijing Institute of Technology 3 Beijing Key Lab for Precision Optoelectronic Measurement Instrument and Technology, School of Optoelectronics, , Beijing 100081, China
  • Ping-Heng Tan
    Chinese Academy of Sciences 1 State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, , Beijing 100083, China

Description

<jats:p>Simultaneous Stokes and anti-Stokes ultralow-frequency (ULF) Raman measurement down to ∼2 cm−1 or 60 GHz is realized by a single-stage spectrometer in combination with volume-Bragg-grating-based notch filters. This system reveals its excellent performance by probing Brillouin signal of acoustic phonons in silicon, germanium, gallium arsenide, and gallium nitride. The deduced sound velocity and elastic constants are in good accordance with previous results determined by various methods. This system can shorten the integration time of the Brillouin signal with a good signal-to-noise ratio by more than 2000-fold compared to a Fabry-Perot interferometer (FPI). This study shows how a filter-based ULF Raman system can be used to reliably achieve Brillouin spectroscopy for condensed materials with high sensitivity and high signal-to-noise ratio, stimulating fast Brillouin spectrum measurements to probe acoustic phonons in semiconductors.</jats:p>

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