A Novel Technique for Optimal Feature Selection in Attribute Profiles Based on Genetic Algorithms

DOI PDF 2 Citations

Journal

IEEE Transactions on Geoscience and Remote Sensing

IEEE Transactions on Geoscience and Remote Sensing 51 (6), 3514-3528, 2013-06

Institute of Electrical and Electronics Engineers (IEEE)

Citations (2)*help

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Details 詳細情報について

CRID

1360013173229472256
DOI

10.1109/tgrs.2012.2224874
ISSN

15580644

01962892
Web Site

http://xplorestaging.ieee.org/ielx5/36/6516926/06410414.pdf?arnumber=6410414
Data Source
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