A Josephson ultrahigh-resolution sampling system
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- David B. Tuckerman
- IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598
Description
<jats:p>An ultrahigh-resolution Josephson-technology sampling system has been designed and tested. A complex test signal containing a 10-ps rise time was measured and agreed very well with the signal expected from simulations. The intrinsic rise time (step response) of the sampling system is believed to be about 6 ps. External analog circuitry was used to automate the system.</jats:p>
Journal
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- Applied Physics Letters
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Applied Physics Letters 36 (12), 1008-1010, 1980-06-15
AIP Publishing
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Details 詳細情報について
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- CRID
- 1360016867698346112
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- DOI
- 10.1063/1.91665
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- ISSN
- 10773118
- 00036951
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- Data Source
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- Crossref