Remaining Useful Lifetime Estimation for Thermally Stressed Power MOSFETs Based on <sc>on</sc>-State Resistance Variation
書誌事項
- 公開日
- 2016-05
- 権利情報
-
- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- https://doi.org/10.15223/policy-029
- https://doi.org/10.15223/policy-037
- DOI
-
- 10.1109/tia.2016.2518127
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Transactions on Industry Applications
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IEEE Transactions on Industry Applications 52 (3), 2554-2563, 2016-05
Institute of Electrical and Electronics Engineers (IEEE)