Improvement of CMOS latch-up immunity using a high energy implanted buried layer
書誌事項
- 公開日
- 1989-02
- 権利情報
-
- https://www.elsevier.com/tdm/userlicense/1.0/
- https://www.elsevier.com/legal/tdmrep-license
- DOI
-
- 10.1016/0168-583x(89)90334-0
- 公開者
- Elsevier BV
この論文をさがす
収録刊行物
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- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 37-38 960-964, 1989-02
Elsevier BV
