Tight-binding analysis of the effect of strain on the band structure of GaN

DOI Web Site Web Site 参考文献43件

説明

<jats:title>Abstract</jats:title> <jats:p>The effects of strain on the band structure of GaN are investigated by using an empirical tight-binding method. The impacts on its bandgap, carrier effective mass, and group velocity are discussed. By analyzing the orbital components at the top of the valence band, the cause of the variation of the band structure including effective-mass exchange is discussed. Analysis of the average group velocity indicates that tensile uniaxial or compressive biaxial strain may be beneficial for achieving higher breakdown voltage in vertical GaN devices due to the smaller group velocity of the valence band. For the same reason, we also predict higher breakdown voltages due to tensile biaxial strain for horizontal devices.</jats:p>

収録刊行物

参考文献 (43)*注記

もっと見る

関連プロジェクト

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ