Deep Semantic Feature Learning for Software Defect Prediction
Journal
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- IEEE Transactions on Software Engineering
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IEEE Transactions on Software Engineering 46 (12), 1267-1293, 2020-12-01
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1360017285927448064
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- ISSN
- 19393520
- 23263881
- 00985589
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- Data Source
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- Crossref