Wide-Bandwidth and High-Sensitivity Measurement Technique of Intrinsic Modulation Response of Semiconductor Lasers
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- Nobuhide Yokota
- Research Institute of Electrical Communication, Tohoku University, Sendai, Japan
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- Tomoharu Nohara
- Research Institute of Electrical Communication and Graduate School of Engineering, Tohoku University, Sendai, Japan
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- Hiroshi Yasaka
- Research Institute of Electrical Communication, Tohoku University, Sendai, Japan
書誌事項
- 公開日
- 2023-08
- 資源種別
- journal article
- 権利情報
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- https://creativecommons.org/licenses/by/4.0/legalcode
- DOI
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- 10.1109/jphot.2023.3296203
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
説明
We propose and demonstrate a measurement technique of the intrinsic modulation responses of semiconductor lasers with high sensitivity in a wide modulation frequency range. The technique is based on the two-tone optical modulation and lock-in detection of an optical spectrum having modulation sidebands. The measured modulation response of a conventional 1.55-μm distributed feedback laser indicates that the lock-in detection improves the signal-to-noise ratio by 22 dB. This significant improvement allows measurement of the modulation response up to 75 GHz even though the 3-dB bandwidth of the distributed feedback laser is only 11 GHz. Our technique is suitable for evaluation of the intrinsic modulation response of wide-bandwidth semiconductor lasers free from device parasitic effects.
収録刊行物
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- IEEE Photonics Journal
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IEEE Photonics Journal 15 (4), 1-6, 2023-08
Institute of Electrical and Electronics Engineers (IEEE)
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キーワード
詳細情報 詳細情報について
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- CRID
- 1360021390767288704
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- ISSN
- 19430655
- 19430647
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- 資料種別
- journal article
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- データソース種別
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- Crossref
- KAKEN
- OpenAIRE