Low-temperature diffusion assisted by femtosecond laser-induced modifications at Ni/SiC interface

詳細情報 詳細情報について

• CRID

  1360284924860328960

• NII論文ID

  210000136095

• DOI

  10.7567/apex.11.016502

• ISSN

  18820786

  18820778

  http://id.crossref.org/issn/18820786

• Web Site

  http://stacks.iop.org/1882-0786/11/i=1/a=016502/pdf

  http://stacks.iop.org/1882-0786/11/i=1/a=016502?key=crossref.4bf088edaa924b040a63c0e5f314d89d

• データソース種別

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  • CiNii Articles
  • KAKEN