Submicron scale image observation with a grazing incidence reflection-type single-shot soft X-ray microscope
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 53 (8), 080302-, 2014-07-03
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360284924866274176
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- NII論文ID
- 210000144288
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- ISSN
- 13474065
- 00214922
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- データソース種別
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- Crossref
- CiNii Articles
- KAKEN