Damage behavior of REE-doped W-based material exposed to high-flux transient heat loads

詳細情報 詳細情報について

• CRID

  1360285707140988672

• DOI

  10.1016/j.fusengdes.2016.11.005

• ISSN

  09203796

• Web Site

  https://api.elsevier.com/content/article/PII:S0920379616306871?httpAccept=text/plain

  https://api.elsevier.com/content/article/PII:S0920379616306871?httpAccept=text/xml

• データソース種別

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