Femtosecond electron diffraction: Preparation and characterization of (110)-oriented bismuth films
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- Gustavo Moriena
- University of Toronto 1 Department of Chemistry and Physics, , 80 St. George Street, Toronto, Ontario M5S3H6, Canada
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- Masaki Hada
- University of Hamburg 2 Max Planck Research Department for Structural Dynamics, , Center for Free Electron Laser Science, DESY, Notkestrasse 85, 22607 Hamburg, Germany
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- Germán Sciaini
- University of Toronto 1 Department of Chemistry and Physics, , 80 St. George Street, Toronto, Ontario M5S3H6, Canada
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- Jiro Matsuo
- Kyoto University 3 Quantum Science and Engineering Center, , Gokasho, Uji Kyoto 611-0011, Japan
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- R. J. Dwayne Miller
- University of Toronto 1 Department of Chemistry and Physics, , 80 St. George Street, Toronto, Ontario M5S3H6, Canada
説明
<jats:p>Here, we present a new approach to synthesize (110)-oriented ultrathin membranes of bismuth (Bi). This rather exotic orientation was achieved by directing the growth through rationale control of lattice matching. Bi films were hetero-epitaxially grown on the (100)-surface of freshly cleaved potassium chloride crystals. The sample orientation was characterized by x-ray and electron diffraction. In addition, high quality free-standing films were obtained after dissolution of the substrate in water and controlled evaporation. Femtosecond electron diffraction (FED) was, therefore, used to monitor the coherent shear acoustic phonons in (110)-oriented free-standing Bi films produced by impulsive femtosecond optical excitation. The small de Broglie wavelength (flat Ewald sphere) of keV-electrons combined with an off-Bragg detection scheme provided a magnified view of shear atomic motions, i.e., lattice distortions in the transverse direction. All-optical pump-probe experiments are usually insensitive to shear displacements, a fact that makes FED a unique non-contact method to achieve the complete characterization of elastic properties of nanoscale materials.</jats:p>
収録刊行物
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- Journal of Applied Physics
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Journal of Applied Physics 111 (4), 043504-, 2012-02-15
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360285708874861312
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- ISSN
- 10897550
- 00218979
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- データソース種別
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- KAKEN