Small-angle electron scattering of magnetic fine structures

書誌事項

公開日
2013-05-13
資源種別
journal article
DOI
  • 10.1093/jmicro/dft007
公開者
Oxford University Press (OUP)

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説明

Magnetic structures in magnetic artificial lattices and chiral magnetic orders in chiral magnets have been quantitatively analyzed in the reciprocal space by means of small-angle electron scattering (SAES) method. Lorentz deflection due to magnetic moments and Bragg diffraction due to periodicity are simultaneously recorded at an angle of the order of or less than 1 × 10(-6) rad, using a camera length of more than 100 m. The present SAES method, together with TEM real-space imaging methods such as in-situ Lorentz microscopy, is very powerful in analyzing magnetic fine structures in magnetic materials. Indeed, the existence of both a chiral helimagnetic structure and a chiral magnetic soliton lattice in a chiral magnet CrNb3S6 has been successfully verified for the first time using the present complementary methods.

収録刊行物

  • Microscopy

    Microscopy 62 (suppl 1), S75-S86, 2013-05-13

    Oxford University Press (OUP)

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