Evaluation of Crystal Lattice Rotation around a Stress-Induced Twin in a Step-Graded SiGe / Si (110) Using STEM Moiré Observation and its Image Analysis
Journal
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- Microscopy and Microanalysis
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Microscopy and Microanalysis 25 (S2), 242-243, 2019-08
Oxford University Press (OUP)
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Keywords
Details 詳細情報について
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- CRID
- 1360286992937217408
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- ISSN
- 14358115
- 14319276
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- Data Source
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- Crossref
- KAKEN