Investigation of irradiation effects on highly integrated leading-edge electronic components of diagnostics and control systems for LHD deuterium operation

詳細情報 詳細情報について

• CRID

  1360292618535916032

• DOI

  10.1088/1741-4326/aa71e8

• ISSN

  17414326

  00295515

  http://id.crossref.org/issn/00295515

• Web Site

  http://stacks.iop.org/0029-5515/57/i=8/a=086012?key=crossref.d64036d36772da7b726dec91766333a9

  http://iopscience.iop.org/article/10.1088/1741-4326/aa71e8/pdf

  http://stacks.iop.org/0029-5515/57/i=8/a=086012/pdf

  http://iopscience.iop.org/article/10.1088/1741-4326/aa71e8

• データソース種別

  • Crossref