抄録
<jats:p>The following fourteen reference patterns of carbide, nitride, telluride, and oxide ceramics are reported. Included in the fourteen reference patterns are data for three high T<jats:sub>c</jats:sub> superconducting oxide related phases (Ba<jats:sub>2</jats:sub>CuO<jats:sub>3</jats:sub>, CuSrO<jats:sub>2</jats:sub>, and Ba<jats:sub>2</jats:sub>Cu<jats:sub>3</jats:sub>YO<jats:sub>6</jats:sub>). The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40 (1986).</jats:p><jats:p>Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2<jats:italic>θ</jats:italic> values for these internal standards are specified in the methods described (<jats:italic>ibid.</jats:italic>). Data were measured with a computer controlled diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform variable indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.</jats:p>
収録刊行物
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- Powder Diffraction
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Powder Diffraction 3 (2), 113-121, 1988-06
Cambridge University Press (CUP)