Low-Background Tip-Enhanced Raman Spectroscopy Enabled by a Plasmon Thin-Film Waveguide Probe

DOI Web Site PubMed 被引用文献4件 参考文献50件 オープンアクセス
  • Kaifeng Zhang
    Research & Development Group, Hitachi, Ltd., Yokohama 244-0817, Kanagawa, Japan
  • Yifan Bao
    State Key Laboratory of Physical Chemistry of Solid Surface, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
  • Maofeng Cao
    State Key Laboratory of Physical Chemistry of Solid Surface, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
  • Shin-ichi Taniguchi
    Research & Development Group, Hitachi, Ltd., Yokohama 244-0817, Kanagawa, Japan
  • Masahiro Watanabe
    Research & Development Group, Hitachi, Ltd., Yokohama 244-0817, Kanagawa, Japan
  • Takuya Kambayashi
    Research & Development Group, Hitachi, Ltd., Yokohama 244-0817, Kanagawa, Japan
  • Toshihiro Okamoto
    Department of Optical Science and Technology, Faculty of Engineering, Tokushima University, Tokushima 770-8501, Japan
  • Masanobu Haraguchi
    Department of Optical Science and Technology, Faculty of Engineering, Tokushima University, Tokushima 770-8501, Japan
  • Xiang Wang
    State Key Laboratory of Physical Chemistry of Solid Surface, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
  • Kei Kobayashi
    Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan
  • Hirofumi Yamada
    Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan
  • Bin Ren
    State Key Laboratory of Physical Chemistry of Solid Surface, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
  • Takehiro Tachizaki
    School of Engineering, Tokai University, Hiratsuka 259-1292, Kanagawa, Japan

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説明

Tip-enhanced Raman spectroscopy (TERS) is a nano-optical approach to extract spatially resolved chemical information with nanometer precision. However, in the case of direct-illumination TERS, which is often employed in commercial TERS instruments, strong fluorescence or far-field Raman signals from the illuminated areas may be excited as a background. They may overwhelm the near-field TERS signal and dramatically decrease the near-field to far-field signal contrast of TERS spectra. It is still challenging for TERS to study the surface of fluorescent materials or a bulk sample that cannot be placed on an Au/Ag substrate. In this study, we developed an indirect-illumination TERS probe that allows a laser to be focused on a flat interface of a thin-film waveguide located far away from the region generating the TERS signal. Surface plasmon polaritons are generated stably on the waveguide and eventually accumulated at the tip apex, thereby producing a spatially and energetically confined hotspot to ensure stable and high-resolution TERS measurements with a low background. With this thin-film waveguide probe, TERS spectra with obvious contrast from a diamond plate can be acquired. Furthermore, the TERS technique based on this probe exhibits excellent TERS signal stability, a long lifetime, and good spatial resolution. This technique is expected to have commercial potential and enable further popularization and development of TERS technology as a powerful analytical method.

収録刊行物

  • Analytical Chemistry

    Analytical Chemistry 93 (21), 7699-7706, 2021-05-20

    American Chemical Society (ACS)

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