X-ray zooming microscopy with two Fresnel zone plates

DOI PDF 被引用文献1件 参考文献15件
  • Daisuke Wakabayashi
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan
  • Yoshio Suzuki
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan
  • Yuki Shibazaki
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan
  • Hiroshi Sugiyama
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan
  • Keiichi Hirano
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan
  • Ryutaro Nishimura
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan
  • Kazuyuki Hyodo
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan
  • Noriyuki Igarashi
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan
  • Nobumasa Funamori
    Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) 1 , Tsukuba 305-0801, Japan

抄録

<jats:p>We propose a variable-magnification full-field x-ray microscope using two Fresnel zone plates (FZPs). By moving the positions of the two FZPs, the magnification can be continuously changed even if the sample and camera positions are fixed. It was demonstrated that the magnification can be changed in the range of 25–150× using a hard x-ray beam at 14.4 keV. Using the first FZP as a convex lens and the second FZP as a concave lens, high magnification can be achieved at a short camera length. Even under the condition of a camera length of about 7 m, a magnification higher than 300× was achieved, and a line and space pattern with a pitch of 40 nm was observed at 10 keV. By inserting a knife edge at an appropriate position in the optical system, a phase-contrast image can be easily obtained, which is useful for soft-tissue observation of biological samples.</jats:p>

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