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Two novel characteristics in palmprint verification: datum point invariance and line feature matching

DOI Web Site Web Site 1 Citations

Journal

Pattern Recognition

Pattern Recognition 32 (4), 691-702, 1999-04

Elsevier BV

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Details 詳細情報について

CRID

1360298345506222208
DOI

10.1016/s0031-3203(98)00117-4
ISSN

00313203
Web Site

https://api.elsevier.com/content/article/PII:S0031320398001174?httpAccept=text/xml

https://api.elsevier.com/content/article/PII:S0031320398001174?httpAccept=text/plain
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