TEM characterization of irradiation-induced dislocation loops and voids in ion-irradiated pure chromium

Details 詳細情報について

• CRID

  1360298755638032000

• DOI

  10.1016/j.jnucmat.2022.153920

• ISSN

  00223115

• Web Site

  https://api.elsevier.com/content/article/PII:S0022311522004068?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S0022311522004068?httpAccept=text/plain

• Data Source

  • Crossref
  • KAKEN