Salient Object Detection in the Deep Learning Era: An In-Depth Survey

DOI PDF 被引用文献1件

Wenguan Wang

ETH Zurich, Zürich, Switzerland
Qiuxia Lai

Department of Computer Science and Engineering, The Chinese University of Hong Kong, Hong Kong, China
Huazhu Fu

Inception Institute of Artificial Intelligence, Abu Dhabi, UAE
Jianbing Shen

Inception Institute of Artificial Intelligence, Abu Dhabi, UAE
Haibin Ling

Department of Computer and Information Sciences, Temple University, Philadelphia, PA, USA
Ruigang Yang

University of Kentucky, Lexington, KY, USA

収録刊行物

IEEE Transactions on Pattern Analysis and Machine Intelligence

IEEE Transactions on Pattern Analysis and Machine Intelligence 44 (6), 3239-3259, 2022-06-01

Institute of Electrical and Electronics Engineers (IEEE)

CRID

1360298760979220736
DOI

10.1109/tpami.2021.3051099
ISSN

21609292

19393539

01628828
Web Site

http://xplorestaging.ieee.org/ielx7/34/9769881/09320524.pdf?arnumber=9320524
データソース種別
- Crossref