Ferroelectric and Piezoelectric Properties of 0.72Pb(Zr0.47Ti0.53)O3–0.28Pb[(Zn0.45Ni0.55)1/3Nb2/3]O3Thick Films for Energy Harvesting Device Application

Young Hun Jeong, Kyoung Bum Kim, Young-Jin Lee, Jeong-Ho Cho, Byoung-Ik Kim, Jong-Hoo Paik, Sahn Nahm

doi:10.1143/jjap.51.09md04

<jats:p>The Ferroelectric and piezoelectric properties of 0.72Pb(Zr<jats:sub>0.47</jats:sub>Ti<jats:sub>0.53</jats:sub>)O<jats:sub>3</jats:sub>–0.28Pb[(Zn<jats:sub>0.45</jats:sub>Ni<jats:sub>0.55</jats:sub>)<jats:sub>1/3</jats:sub>Nb<jats:sub>2/3</jats:sub>]O<jats:sub>3</jats:sub>(PZT–PZNN) piezoelectric thick films were investigated for application to energy harvesting devices. The PZT–PZNN thick films were fabricated by a conventional tape casting process. The sintered PZT–PZNN thick film was highly dense and flat when the annealed temperature was 1100 °C. It exhibited substantial ferroelectric and piezoelectric properties of<jats:italic>P</jats:italic><jats:sub>r</jats:sub>= 20.6 µC/cm<jats:sup>2</jats:sup>,<jats:italic>d</jats:italic><jats:sub>33</jats:sub>= 370 pC/N, ε<jats:sup>T</jats:sup><jats:sub>33</jats:sub>/ε<jats:sub>0</jats:sub>= 1185, and<jats:italic>k</jats:italic><jats:sub>p</jats:sub>= 0.44. Moreover, its<jats:italic>d</jats:italic><jats:sub>33</jats:sub>·<jats:italic>g</jats:italic><jats:sub>33</jats:sub>, which can characterize high energy density material, is as large as approximately 13050×10<jats:sup>-15</jats:sup>m<jats:sup>2</jats:sup>/N. Therefore, the PZT–PZNN thick film can be a potential piezoelectric material for application to energy harvesting devices.</jats:p>

Ferroelectric and Piezoelectric Properties of 0.72Pb(Zr<sub>0.47</sub>Ti<sub>0.53</sub>)O<sub>3</sub>–0.28Pb[(Zn<sub>0.45</sub>Ni<sub>0.55</sub>)<sub>1/3</sub>Nb<sub>2/3</sub>]O<sub>3</sub>Thick Films for Energy Harvesting Device Application

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