Multiple breakdown model of carpet-bombing-like concaves formed during dielectric breakdown of silicon carbide metal–oxide–semiconductor capacitors
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 53 (8S1), 08LA01-, 2014-07-01
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360566399843000704
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- NII論文ID
- 210000144325
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- ISSN
- 13474065
- 00214922
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- データソース種別
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- Crossref
- CiNii Articles
- KAKEN