Characterization of ion-sensitive extended-gate field effect transistor coated with functional self-assembled monolayer

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Japanese Journal of Applied Physics

Japanese Journal of Applied Physics 54 (4S), 04DL06-, 2015-03-24

IOP Publishing

CRID

1360566399843321472
NII Article ID

210000145068
DOI

10.7567/jjap.54.04dl06
ISSN

13474065

00214922

http://id.crossref.org/issn/13474065
Web Site

http://stacks.iop.org/1347-4065/54/i=4S/a=04DL06/pdf

http://stacks.iop.org/1347-4065/54/i=4S/a=04DL06?key=crossref.ef10ef67fefd0f12ca37413768273f6d
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journal article
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