Differential-phase-contrast knife-edge scan method for precise evaluation of X-ray nanobeam
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 54 (9), 092401-, 2015-08-28
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360566399843564416
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- NII論文ID
- 210000145659
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- ISSN
- 13474065
- 00214922
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- データソース種別
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