Recent progress in synchrotron radiation 3D–4D nano-imaging based on X-ray full-field microscopy
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- Akihisa Takeuchi
- Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Sayo, Hyogo 679-5198, Japan
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- Yoshio Suzuki
- Graduate School of Frontier Science, University of Tokyo, Kasiwa, Chiba 277-8561, Japan
説明
<jats:title>Abstract</jats:title> <jats:p>The advent of high-flux, high-brilliance synchrotron radiation (SR) has prompted the development of high-resolution X-ray imaging techniques such as full-field microscopy, holography, coherent diffraction imaging and ptychography. These techniques have strong potential to establish non-destructive three- and four-dimensional nano-imaging when combined with computed tomography (CT), called nano-tomography (nano-CT). X-ray nano-CTs based on full-field microscopy are now routinely available and widely used. Here we discuss the current status and some applications of nano-CT using a Fresnel zone plate as an objective. Optical properties of full-field microscopy, such as spatial resolution and off-axis aberration, which determine the effective field of view, are also discussed, especially in relation to 3D tomographic imaging.</jats:p>
収録刊行物
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- Microscopy
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Microscopy 69 (5), 259-279, 2020-05-06
Oxford University Press (OUP)
