Scanning Moiré Fringe Method: A Superior Approach to Perceive Defects, Interfaces, and Distortion in 2D Materials

DOI Web Site 1 Citations 32 References

Yung-Chang Lin

Nanomaterials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan
Hyun Goo Ji

Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Fukuoka 816-8580, Japan
Li-Jen Chang

Information and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, Taiwan
Yao-Pang Chang

Department of Electrical Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan
Zheng Liu

Innovative Functional Materials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Nagoya 463-8560, Japan
Gun-Do Lee

Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul 151-742, Republic of Korea
Po-Wen Chiu

Department of Electrical Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan
Hiroki Ago

Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Fukuoka 816-8580, Japan
Kazu Suenaga

Nanomaterials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan

Journal

ACS Nano

ACS Nano 14 (5), 6034-6042, 2020-04-23

American Chemical Society (ACS)

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