Beyond simple small-angle X-ray scattering: developments in online complementary techniques and sample environments
説明
<jats:p>Small- and wide-angle X-ray scattering (SAXS, WAXS) are standard tools in materials research. The simultaneous measurement of SAXS and WAXS data in time-resolved studies has gained popularity due to the complementary information obtained. Furthermore, the combination of these data with non X-ray based techniques,<jats:italic>via</jats:italic>either simultaneous or independent measurements, has advanced understanding of the driving forces that lead to the structures and morphologies of materials, which in turn give rise to their properties. The simultaneous measurement of different data regimes and types, using either X-rays or neutrons, and the desire to control parameters that initiate and control structural changes have led to greater demands on sample environments. Examples of developments in technique combinations and sample environment design are discussed, together with a brief speculation about promising future developments.</jats:p>
収録刊行物
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- IUCrJ
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IUCrJ 1 (6), 478-491, 2014-09-23
International Union of Crystallography (IUCr)
