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- R. Leroy
- Laboratoire de Physique des Milieux Ionisés, Laboratoire du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- M. Bacal
- Laboratoire de Physique des Milieux Ionisés, Laboratoire du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- P. Berlemont
- Laboratoire de Physique des Milieux Ionisés, Laboratoire du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- C. Courteille
- Laboratoire de Physique des Milieux Ionisés, Laboratoire du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- R. A. Stern
- Laboratoire de Physique des Milieux Ionisés, Laboratoire du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
抄録
<jats:p>A new technique using laser induced photodetachment has been developed for measuring the negative ion temperature in H− and D− sources. Using this technique, we have investigated the dependence of the negative ion temperature on source parameters such as pressure, discharge current, and electron temperature. Simultaneous measurements of negative ion density, temperature, and extracted current lead to the conclusion that the extracted negative ion current is, at most, equal to the thermal flux.</jats:p>
収録刊行物
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- Review of Scientific Instruments
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Review of Scientific Instruments 63 (4), 2686-2688, 1992-04-01
AIP Publishing
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キーワード
詳細情報 詳細情報について
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- CRID
- 1360574094377308032
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- NII論文ID
- 30015954734
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- ISSN
- 10897623
- 00346748
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- データソース種別
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- Crossref
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