The recrystallized grain size piezometer for quartz: An EBSD‐based calibration

DOI Web Site Web Site 被引用文献7件
  • A. J. Cross
    Department of Earth and Planetary Sciences Washington University in St. Louis St. Louis Missouri USA
  • D. J. Prior
    Department of Geology University of Otago Dunedin New Zealand
  • M. Stipp
    Institute of Geology University of Innsbruck Innsbruck Austria
  • S. Kidder
    Department of Earth and Atmospheric Science City College of New York New York New York USA

書誌事項

公開日
2017-07-05
権利情報
  • http://onlinelibrary.wiley.com/termsAndConditions#vor
DOI
  • 10.1002/2017gl073836
公開者
American Geophysical Union (AGU)

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説明

<jats:title>Abstract</jats:title><jats:p>We have reanalyzed samples previously used for a quartz recrystallized grain size paleopiezometer, using electron backscatter diffraction (EBSD). Recrystallized and relict grains are separated using their grain orientation spread, which acts as a measure of intragranular lattice distortion and a proxy for dislocation density. For EBSD maps made with a 1 μm step size, the piezometer relationship is <jats:styled-content><jats:italic>D</jats:italic> = 10<jats:sup>3.91 ± 0.41</jats:sup> ∙ <jats:italic>σ</jats:italic><jats:sup>−1.41 ± 0.21</jats:sup></jats:styled-content> (for root‐mean‐square mean diameter values). We also present a “sliding resolution” piezometer relationship, <jats:styled-content><jats:italic>D</jats:italic> = 10<jats:sup>4.22 ± 0.51</jats:sup> ∙ <jats:italic>σ</jats:italic><jats:sup>−1.59 ± 0.26</jats:sup></jats:styled-content>, that combines 1 μm step size data at coarser grain sizes with 200 nm step size data at finer grain sizes. The sliding resolution piezometer more accurately estimates stress in fine‐grained (<10 μm) samples. The two calibrations give results within 10% of each other for recrystallized grain sizes between 10 μm and 100 μm. Both piezometers match the original light optical microscopy quartz piezometer within error.</jats:p>

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