Electric-field-profile measurement along a probing laser path based on electric-field-induced second-harmonic generation

詳細情報 詳細情報について

• CRID

  1360576118826829440

• DOI

  10.1103/physreva.104.053511

• ISSN

  24699934

  24699926

• Web Site

  https://link.aps.org/article/10.1103/PhysRevA.104.053511

  http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.104.053511/fulltext

• データソース種別

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  • KAKEN