Performance and hot-carrier effects of small CRYO-CMOS devices

DOI PDF 2 Citations

Journal

IEEE Transactions on Electron Devices

IEEE Transactions on Electron Devices 34 (1), 8-18, 1987-01

Institute of Electrical and Electronics Engineers (IEEE)

Citations (2)*help

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Details 詳細情報について

CRID

1360579818775630080
DOI

10.1109/t-ed.1987.22880
ISSN

00189383
Web Site

http://xplorestaging.ieee.org/ielx5/16/31973/01486591.pdf?arnumber=1486591
Data Source
- Crossref

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