Electronic states associated with the 60° edge dislocation in silicon

Details 詳細情報について

• CRID

  1360579820315150976

• DOI

  10.1080/14786437708235971

• ISSN

  00318086

• Web Site

  http://www.tandfonline.com/doi/pdf/10.1080/14786437708235971

• Data Source

  • Crossref