Simons Observatory: broadband metamaterial antireflection cuttings for large-aperture alumina optics
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- Joseph E. Golec
- Fermi National Accelerator Laboratory
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- Rebecca Jackson
- Fermi National Accelerator Laboratory
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- Jerry Zimmerman
- Fermi National Accelerator Laboratory
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- Simon R. Dicker
- University of Pennsylvania
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- Jeffrey Iuliano
- University of Pennsylvania
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- Jeff McMahon
- Fermi National Accelerator Laboratory
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- Giuseppe Puglisi
- Università di Roma Tor Vergata
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- Carole Tucker
- Cardiff University
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- Edward J. Wollack
- NASA/Goddard Space Flight Center
抄録
<jats:p>We present the design, fabrication, and measured performance of metamaterial antireflection cuttings (ARCs) for large-format alumina filters operating over more than an octave of bandwidth to be deployed at the Simons Observatory (SO). The ARC consists of subwavelength features diced into the optic’s surface using a custom dicing saw with near-micrometer accuracy. The designs achieve percent-level control over reflections at angles of incidence up to <jats:inline-formula> <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mrow class="MJX-TeXAtom-ORD"> <mml:msup> <mml:mn>20</mml:mn> <mml:mo>∘<!-- ∘ --></mml:mo> </mml:msup> </mml:mrow> </mml:math> </jats:inline-formula>. The ARCs were demonstrated on four 42 cm diameter filters covering the 75 to 170 GHz band and a 50 mm diameter prototype covering the 200 to 300 GHz band. The reflection and transmission of these samples were measured using a broadband coherent source that covers frequencies from 20 GHz to 1.2 THz. These measurements demonstrate percent-level control over reflectance across the targeted pass-bands and a rapid reduction in transmission as the wavelength approaches the length scale of the metamaterial structure where scattering dominates the optical response. The latter behavior enables use of the metamaterial ARC as a scattering filter in this limit.</jats:p>
収録刊行物
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- Applied Optics
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Applied Optics 61 (30), 8904-, 2022-10-11
Optica Publishing Group
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キーワード
詳細情報 詳細情報について
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- CRID
- 1360580236256214144
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- ISSN
- 21553165
- 1559128X
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- データソース種別
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- Crossref