Testbed for 5G Connected Artificial Intelligence on Virtualized Networks
Journal
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- IEEE Access
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IEEE Access 8 223202-223213, 2020
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1360580236961826688
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- ISSN
- 21693536
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- Data Source
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- Crossref